Colloquium Speaker

Michael Ernst, Associate Professor, Department of Electrical Engineering and Computer Science, MIT
Automated Generation and Classification of Test Inputs
Date: Thursday, October 27, 2005
Time: 11:00AM
Place: Gould-Simpson, Room 906
Refreshments will be served in the 9th floor atrium of Gould-Simpson at 10:45 AM


This talk describes a technique that selects, from a large set of test inputs, a small subset likely to reveal faults in the software under test. The technique takes a program or software component, plus a set of correct executions -- say, from observations of the software running properly, or from an existing test suite that a user wishes to enhance. The technique first infers an operational model of the software's operation. Then, inputs whose operational pattern of execution differs from the model in specific ways are suggestive of faults. These inputs are further reduced by selecting only one input per operational pattern. The result is a small portion of the original inputs, deemed by the technique as most likely to reveal faults. Thus, the technique can also be seen as an error-detection technique.

The talk describes two additional techniques that complement test input selection. One is a technique for automatically producing an oracle (a set of assertions) for a test input from the operational model, thus transforming the test input into a test case. The other is a classification-guided test input generation technique that also makes use of operational models and patterns. When generating inputs, it filters out code sequences that are unlikely to contribute to legal inputs, improving the efficiency of its search for fault-revealing inputs.

We have implemented these techniques in the Eclat tool, which generates unit tests for Java classes. Eclat's input is a set of classes to test and an example program execution -- say, a passing test suite. Eclat's output is a set of JUnit test cases, each containing a potentially fault-revealing input and a set of assertions at least one of which fails. In our experiments, Eclat successfully generated inputs that exposed fault-revealing behavior; we have used Eclat to reveal real errors in programs. The inputs it selects as fault-revealing are an order of magnitude as likely to reveal a fault as all generated inputs.

Michael D. Ernst is an Associate Professor in Department of Electrical Engineering and Computer Science at Massachusetts Institute of Technology (MIT), Cambridge, Massachusetts. He is also Ross Career Development Professor of Software Technology and a Principal Investigator in Computer Science and Artificial Intelligence Laboratory (CSAIL) at MIT. His main research interest is in programmer productivity, which spans the spectrum from software engineering, through compilation, to programming language design. He received his PhD in Computer Science and Engineering from the University of Washington, Seattle.